Collection of ENEA technology and expertise
NIXT laboratory to perform X-ray analysis, by means of imaging, tomography or spectroscopy, of samples or to calibrate or characterize detectors
The technology allows the analysis with imaging at high resolution (55 microns) and the spectral analysis at level of single pixel. This combination boosts enormously the analysis capability
External view of the NIXT Laboratory
Internal view of the NIXT laboratory
Application sectors
Problem to solve
Biological or vegetal samples samples have to be investigated at low X-ray energy (2-30 keV) and commercial devices are not available. the same it is for low density materials (foams, carbon fibers...). This technique is useful also for recognition of multilayered materials
Description
The technology allows the analysis with imaging at high resolution (55 microns) and the spectral analysis at level of single pixel. This combination boosts enormously the analysis capability
Innovative aspects and advantages
- Combination of imaging and spectral resolution
Technological Maturity 7
Strengths
- Cost
- Social/economic relevance
- Legal/regulatory content
- Efficiency/productivity/performance
- Innovation
Admissible applications
- Biologia marina, specie vegetali , campioni di tessuto
- analisi industriale di leghe leggere alluminio o magnesio
- analisi materiali multistrato come per esempio per i pannelli fotovoltaici
- riconoscimento di materiali plastici, metallici o altro per il recycling
- studio di nuovi materiali leggeri per aeronautica
Research group involved
Revision date
25-06-2025
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