Collection of ENEA technology and expertise
Method and Apparatus for Measuring the Intensity of Light Scattered by a Material. An innovative profilometer that allows for the rapid analysis of surface imperfections and roughness
The present invention describes a methodology for analyzing light scattered or diffused by a diffusive sample, based on the scattering of the light beam emitting from the sample being examined and incident on a fluorescent diffuser. The image is captured using a digital camera and subsequently processed. Of fundamental importance to this apparatus is the fluorescent screen, which re-emits the radiation in all directions, allowing for a 3D mapping of the scattered light without having to perform angular measurements or use integrating spheres
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Application sectors
Problem to solve
TECHNICAL PROBLEM SOLVED: - Multiple angular measurements are no longer necessary to obtain a complete three-dimensional map of the beam exiting the sample. Measurement times are reduced. - If taken at a fixed distance, the measurement is immediate and can be performed without considering the variation in the sample's response over time (e.g., degradation over time, the possibility of a dispersion precipitating in solution, etc.). - Repeated measurements can be performed to obtain information on the temporal behavior of the sample under examination. - Instantaneous information on the n and k indices and their temporal evolution can be obtained (with the possibility of following chemical-physical phenomena of aggregation, cross-linking, etc. over time). - Evaluation of the particle aspect factor and their degree of alignment without having to repeat angular measurements several times. - Evaluation of film uniformity
Description
The present invention describes a methodology for analyzing scattered or diffused light from a diffusive sample, based on the scattering of the light beam emitted by the sample and incident on a fluorescent diffuser. The image is captured using a digital camera and subsequently processed. The setup is very simple and compact; the key element of the proposed setup is the scattered light analysis, which is performed by positioning the "fluorescent diffuser + CCD camera" block at various distances from the sample, providing detailed information on the scattered light at various angles (and thus greater resolution). The measurement setup includes a mirror to eliminate direct, unscathed light from the laser. This allows the camera to use a longer exposure time without partially saturating its pixels, which could potentially damage them. Furthermore, using a suitable bandpass filter would allow selecting only the portion of radiation coming from the fluorescent screen, filtering out the laser radiation scattered by the sample. The fluorescent surface has the peculiarity of transmitting light in all directions in a Lambertian mode, with equal intensity in all directions
Innovative aspects and advantages
- -Analysis of the entire scattered light distribution using a simple and flexible system
- -Improved resolution of scattered light both for small solid angles and for almost the entire solid angle exiting the sample under examination
- -Measurement of the variation in angular distribution with varying wavelength using a tunable source
- -Pssibiliy to measure the entire scattered light distribution in real time
- -Simple post-processing data
Technological Maturity 4
Strengths
- Cost
- Social/economic relevance
- Legal/regulatory content
- Efficiency/productivity/performance
- Innovation
- Lack of technology/solution for the specific task
- Scalability
- Ease of use
Admissible applications
- Roughness analysis of surfaces manufactured for automotive or aerospace applications. It can be used to verify material uniformity and diagnose irregularities
- Scattering analysis from solutions
- Surface deformation analysis. The device can be used as a sensor for real-time measurements
Research group involved
Patent Available for Licensing
Disponibile per una licenza esclusiva
Revision date
16-02-2026
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